Checkerboard-ordered pattern of Bi0.5Sr0.5MnO3 low-temperature phase probed by x-ray resonant scattering

G. Subías, J. García, P. Beran, M. Nevřiva, M. C. Sánchez, and J. L. García-Muñoz
Phys. Rev. B 73, 205107 – Published 12 May 2006

Abstract

Resonant x-ray scattering (RXS) at the Mn K edge has been used to characterize the low temperature ordered phase of Bi0.5Sr0.5MnO3. Strong resonances were observed for the (030), (050), (0520), (0720), (4120), and (3120) reflections as the photon energy is tuned through the Mn K edge. The reported azimuthal and polarization dependence of the resonant intensities indicates that the low temperature phase is described as a checkerboard ordering of two types of Mn sites with different local geometrical structures. One of the sites is anisotropic, a tetragonal distorted oxygen octahedron and the other one is isotropic, a nearly undistorted oxygen octahedron. The distinction of these two Mn sites is accompanied by a displacement of the Mn atoms transverse to the b axis. We conclude that this checkerboard-ordered pattern is a common ground state in half-doped manganites. Intermediate valence states according to fractional charge segregation were deduced for the two nonequivalent Mn atoms, far from the localized Mn3+ and Mn4+ ionic species. Hence, the experimental data discard the ionic model of charge and orbital ordering of localized 3d (or 3d-like) states at the Mn site (or the MnO6 cluster). We suggest a description of the RXS in terms of band structure effects and lattice dynamics.

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  • Received 31 May 2005

DOI:https://doi.org/10.1103/PhysRevB.73.205107

©2006 American Physical Society

Authors & Affiliations

G. Subías1, J. García1,*, P. Beran2, M. Nevřiva3, M. C. Sánchez1, and J. L. García-Muñoz2

  • 1Instituto de Ciencia de Materiales de Aragón, Departamento de Física de la Materia Condensada, CSIC-Universidad de Zaragoza, C/Pedro Cerbuna 12, 50009 Zaragoza, Spain
  • 2Institut de Ciència de Materials de Barcelona, CSIC, Campus Universitari de Bellaterra, E-08193 Bellaterra, Spain
  • 3Institute of Chemical Technology, Technická 5, 16628 Prague 6, Czech Republic

  • *Author to whom correspondence should be addressed. Email address: jgr@unizar.es

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Vol. 73, Iss. 20 — 15 May 2006

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