Magnetization process in Sm40Fe60(88nm)/Ni80Fe20(62nm) exchange spring films

D. Chumakov, R. Schäfer, D. Elefant, D. Eckert, L. Schultz, S. S. Yan, and J. A. Barnard
Phys. Rev. B 66, 134409 – Published 9 October 2002
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Abstract

The magnetization reversal in a sputtered Sm40Fe60(88nm)/Ni80Fe20(62nm) hard/soft bilayer with induced uniaxial anisotropy was investigated by Kerr microscopy and magnetometry. In the reversible regime of the hysteresis loop a twisting of magnetization across the thickness of the soft magnetic film could be derived. The hard layer reverses by the nucleation and growth of regular domains. They are separated from the nonswitched areas by tilted domain walls, the angle of which can be predicted by considering the net magnetic moments of the bilayer system.

  • Received 28 February 2002

DOI:https://doi.org/10.1103/PhysRevB.66.134409

©2002 American Physical Society

Authors & Affiliations

D. Chumakov1, R. Schäfer1, D. Elefant1, D. Eckert1, L. Schultz1, S. S. Yan2, and J. A. Barnard3

  • 1IFW-Dresden, Helmholtz-Strasse 20, D-01069 Dresden, Germany
  • 2National High Magnetic Field Laboratory, 1800 E. Paul Dirac Drive, Box 4005, Tallahassee, Florida 32310
  • 3Department of Materials Science and Engineering, University of Pittsburgh, Pittsburgh, Pennsylvania 15261

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Issue

Vol. 66, Iss. 13 — 1 October 2002

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