Gate voltage dependence of a single-electron transistor using the shuttle mechanism

Norihiko Nishiguchi
Phys. Rev. B 65, 035403 – Published 14 December 2001
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Abstract

The gate voltage dependence of a single-electron transistor using the shuttle mechanism in which a vibrating conductive nanoparticle carries charges between the electrodes is studied theoretically and with numerical simulations. Two types of gate voltage effect on the transport properties are demonstrated: one is direct modulation of the current via modification in the tunneling rate, giving rise to shift of I/V peaks on the step-like current, splitting of the current steps and periodic behavior of the current with the change in gate voltage. Another is an indirect effect due to a shift in the range of the nanoparticle vibration induced by the gate voltage. The latter effect stops the shuttle mechanism at a large gate voltage, leading to the conduction gap which widens in proportion to the gate voltage.

  • Received 10 July 2001

DOI:https://doi.org/10.1103/PhysRevB.65.035403

©2001 American Physical Society

Authors & Affiliations

Norihiko Nishiguchi

  • Department of Applied Physics, School of Engineering, Hokkaido University, Sapporo 060-8628, Japan

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Vol. 65, Iss. 3 — 15 January 2002

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