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Soft-x-ray resonant magnetic diffuse scattering from strongly coupled Cu/Co multilayers

T. P. A. Hase, I. Pape, B. K. Tanner, H. Dürr, E. Dudzik, G. van der Laan, C. H. Marrows, and B. J. Hickey
Phys. Rev. B 61, R3792(R) – Published 1 February 2000
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Abstract

By separately identifying magnetic and charge scatter, we find conclusive evidence for conformality in magnetic roughness in {Co (8 Å) Cu (9 Å)} multilayers. For layers magnetized in the easy direction, the magnetic roughness equals the structural roughness but increases when magnetized in the hard direction. The in-plane magnetic correlation length, which changes on magnetization, is several orders of magnitude larger than the structural roughness length scales. The magnetic length scale is of the same order as magnetic ripple observed in Lorentz microscopy and is not associated with domains.

  • Received 22 September 1999

DOI:https://doi.org/10.1103/PhysRevB.61.R3792

©2000 American Physical Society

Authors & Affiliations

T. P. A. Hase, I. Pape, and B. K. Tanner

  • Department of Physics, University of Durham, South Road, Durham DH1 3LE, United Kingdom

H. Dürr*, E. Dudzik, and G. van der Laan

  • Daresbury Laboratory, Daresbury, Warrington WA4 4AD, United Kingdom

C. H. Marrows and B. J. Hickey

  • Department of Physics and Astronomy, University of Leeds, Leeds LS2 9JT, United Kingdom

  • *Present address: Institut für Festkörperforschung, Forschungszentrum Jülich, 52425 Jülich, Germany.

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Vol. 61, Iss. 6 — 1 February 2000

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