Path-integral effective-potential method applied to extended x-ray-absorption fine-structure cumulants

Toshihiko Yokoyama
Phys. Rev. B 57, 3423 – Published 1 February 1998
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Abstract

The path-integral effective-potential (EP) method was applied to the calculations of extended x-ray-absorption fine-structure (EXAFS) cumulants. Temperature dependence of the EXAFS cumulants up to the third or fourth order for diatomic Br2 and solid fcc Kr and Ni were evaluated. In the case of solid Kr, the pair-potential approximation was employed to describe van der Waals interactions, while for Ni metal the embedded atom method (EAM) that accounts for many-body interactions in metallic bonds was applied. Although the EAM calculation is usually performed based on classical statistics, quantum-mechanical corrections were found to be carried out in a straightforward manner by means of the EP technique. The evaluated EXAFS cumulants were compared to those obtained experimentally and excellent agreement was achieved. The usefulness of the EP technique in the study of temperature-dependent EXAFS is discussed by comparing the other approach of the quantum-statistical perturbation theory.

  • Received 7 July 1997

DOI:https://doi.org/10.1103/PhysRevB.57.3423

©1998 American Physical Society

Authors & Affiliations

Toshihiko Yokoyama

  • Department of Chemistry, Graduate School of Science, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113, Japan

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Issue

Vol. 57, Iss. 6 — 1 February 1998

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