Shot noise of single-electron tunneling in one-dimensional arrays

K. A. Matsuoka and K. K. Likharev
Phys. Rev. B 57, 15613 – Published 15 June 1998
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Abstract

We have used numerical modeling and a semianalytical calculation method to find the low-frequency value SI(0) of the spectral density fluctuations of current through one-dimensional arrays of small tunnel junctions, using the “orthodox” theory of single-electron tunneling. In all three array types studied, at low temperature (kBTeV) increasing current induces a crossover from the Schottky value SI(0)=2eĪ to the “reduced Schottky value” SI(0)=2eĪ/N (where N is the array length) at some crossover current Ic. In uniform arrays over a ground plane, Ic is proportional to exp(λN/3), where λ1 is the single-electron soliton length. In arrays without a ground plane, Ic decreases slowly with both N and λ. Finally, we have calculated the statistics of Ic for ensembles of arrays with random background charges. The standard deviation of Ic from the ensemble average Ic is quite large, typically between 0.5 and 0.7 of Ic, while the dependence of Ic on N or λ is so weak that it is hidden within the random fluctuations of the crossover current.

  • Received 20 January 1998

DOI:https://doi.org/10.1103/PhysRevB.57.15613

©1998 American Physical Society

Authors & Affiliations

K. A. Matsuoka and K. K. Likharev

  • Department of Physics, State University of New York, Stony Brook, New York 11794-3800

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Issue

Vol. 57, Iss. 24 — 15 June 1998

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