Finite-frequency shot noise in a single-electron transistor

Ulrik Hanke, Yu. M. Galperin, and K. A. Chao
Phys. Rev. B 50, 1595 – Published 15 July 1994
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Abstract

Our previous work on finite-frequency shot noise S(ω) in a correlated tunneling current has been extended to investigate the shot-noise behavior in a single-electron transistor (SET), with emphasis on asymmetric SET. We found that both the increase of the asymmetry and the increase of the gate voltage will broaden S(ω), and S(0) is further suppressed by the gate capacitance. At low bias voltage, a condition is obtained under which the noise spectrum S(ω) is white (frequency-independent). We have also demonstrated at the quantitative level how the signal-to-noise ratio in a SET can be controlled by adjusting the gate voltage and the degree of asymmetry.

  • Received 14 March 1994

DOI:https://doi.org/10.1103/PhysRevB.50.1595

©1994 American Physical Society

Authors & Affiliations

Ulrik Hanke

  • Division of Physics, Department of Physics and Mathematics, Norwegian Institute of Technology, The University of Trondheim, N 7034 Trondheim, Norway

Yu. M. Galperin

  • Department of Physics, University of Oslo, P.O. Box 1048 Blindern, N 0316 Oslo 3, Norway
  • A. F. Ioffe Physico-Technical Institute, 194021 St. Petersburg, Russia

K. A. Chao

  • Division of Physics, Department of Physics and Mathematics, Norwegian Institute of Technology, The University of Trondheim, N 7034 Trondheim, Norway

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Vol. 50, Iss. 3 — 15 July 1994

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