Transport properties of nitrogen-doped hydrogenated amorphous germanium films

A. R. Zanatta and I. Chambouleyron
Phys. Rev. B 46, 2119 – Published 15 July 1992
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Abstract

This paper discusses experimental data referring to the electronic properties of N-doped hydrogenated amorphous germanium films (a-Ge:H). The a-Ge:H films, prepared by rf sputtering, possess a low density of electronic states in the pseudogap (in the low 1016 cm3 range) and exhibit a temperature-activated dark conductivity down to below 200 K. It is shown that N atoms incorporated into the a-Ge:H films produce large changes of both the room-temperature dark conductivity and the activation energy. The results of the present work are consistent with the overall picture of the active doping mechanism of group-V elements in tetrahedrally coordinated amorphous semiconductors. The donor level introduced by fourfold-coordinated nitrogen in a-Ge:H is found to be around 50 meV below the conduction-band edge.

  • Received 28 January 1992

DOI:https://doi.org/10.1103/PhysRevB.46.2119

©1992 American Physical Society

Authors & Affiliations

A. R. Zanatta and I. Chambouleyron

  • Instituto de Física, Universidade Estadual de Campinas, P.O. Box 6165, Campinas, São Paulo, 13081 Brazil

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Vol. 46, Iss. 4 — 15 July 1992

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