Critical-temperature inhomogeneities and resistivity rounding in copper oxide superconductors

J. Maza and Félix Vidal
Phys. Rev. B 43, 10560 – Published 1 May 1991
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Abstract

By using effective-medium approaches, we obtain the onset of the electrical-resistivity rounding, above the normal-superconducting transition, associated with inhomogeneities of the mean-field critical temperature Tc0 at scales larger than the superconducting correlation length. These results are compared with available data in single-crystal and single-phase (to within 4%) polycrystalline YBa2Cu3O7δ samples. This comparison shows that the measured resistivity rounding cannot be explained by these types of local Tc0 inhomogeneities. Complementarily, our calculations allow us to check some proposals on Tc0 inhomogeneities associated with local sample strains or oxygen-content variations. The interplay between Tc0 inhomogeneities and superconducting order-parameter fluctuations (SCOPF) leads to the conclusion that in the mean-field-like region (MFR) above the superconducting transition, the Tc0 inhomogeneity contribution to the measured resistivity rounding in high-quality (single-phase) cuprate oxide superconductors is negligible. In contrast, our analysis confirms that in the MFR these effects may be explained quantitatively on the grounds of the Lawrence-Doniach theory for SCOPF.

  • Received 11 March 1991

DOI:https://doi.org/10.1103/PhysRevB.43.10560

©1991 American Physical Society

Authors & Affiliations

J. Maza and Félix Vidal

  • Laboratorio de Física de Materiales, Facultad de Física, Universidad de Santiago, 15700 Santiago, Spain

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Issue

Vol. 43, Iss. 13 — 1 May 1991

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