Γ-X mixing effect in GaAs/AlAs superlattices and heterojunctions

Jian-Bai Xia
Phys. Rev. B 41, 3117 – Published 15 February 1990
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Abstract

The Γ-X mixing effect on the subband structure of superlattice (GaAs)12/(AlAs)12 is investigated with both the pseudopotential method and the effective-mass method. The results derived from the two methods show reasonable agreement, and the best-fitting Γ-X scattering parameter t is determined to be 0.5. The transmission probabilities of the Γ-point electron through the bound X-point states in the AlAs layer are calculated quantitatively. It is found that the resonant peaks correspond completely to the eigenstates of the corresponding superlattice, and the Γ-resonant peak is relatively smaller than the X-resonant peaks. Under the applied electric field, the resonant peaks originating from two barriers separate, resulting in a reduction of the peak-to-valley ratio.

  • Received 20 July 1989

DOI:https://doi.org/10.1103/PhysRevB.41.3117

©1990 American Physical Society

Authors & Affiliations

Jian-Bai Xia

  • China Center of Advanced Science and Technology (World Laboratory), P.O. Box 8730, Beijing 100080, China
  • Institute of Semiconductors, Chinese Academy of Sciences, P.O. Box 912, Beijing 100 083, China

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Vol. 41, Iss. 5 — 15 February 1990

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