Abstract
The resistance as a function of tip-sample separation in the scanning tunneling microscope is calculated for distances in the transition region between tunneling and point contact. A resistance plateau appears near point contact with value , where is of order unity, its exact value depending on the identity of the tip atom. Good agreement is found with the recent experimental data of Gimzewski and Möller.
- Received 10 July 1987
DOI:https://doi.org/10.1103/PhysRevB.36.8173
©1987 American Physical Society