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Microscopic calculation of the surface contribution to optical reflectivity: Application to Si

A. Selloni, P. Marsella, and R. Del Sole
Phys. Rev. B 33, 8885(R) – Published 15 June 1986
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Abstract

A microscopic calculation of the surface optical properties of Si(111) and Si(110) within the randomphase approximation is presented. Surface effects on optical matrix elements are found important in order to explain the anisotropic reflectance observed at surfaces of cubic semiconductors. At frequencies above the bulk indirect gap, a large contribution to differential reflectivity turns out to be related to the structural changes occurring upon oxidation.

  • Received 2 January 1986

DOI:https://doi.org/10.1103/PhysRevB.33.8885

©1986 American Physical Society

Authors & Affiliations

A. Selloni, P. Marsella, and R. Del Sole

  • Dipartimento di Fisica, II Università di Roma, Rome, Italy

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Issue

Vol. 33, Iss. 12 — 15 June 1986

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