Size effects in metallic thin films

G. Govindaraj and V. Devanathan
Phys. Rev. B 32, 2628 – Published 15 August 1985
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Abstract

The relaxation time derived with use of the thickness-dependent thin-film Thomas-Fermi impurity potential in the collision term of the Boltzmann transport equation is used to study the classical size effects in the Hall coefficient Rf and magnetoresistance Mf in metallic thin films. The theoretical prediction of Rf agrees well with experimental results. The dependence of Mf on thickness and magnetic field is also discussed.

  • Received 23 April 1984

DOI:https://doi.org/10.1103/PhysRevB.32.2628

©1985 American Physical Society

Authors & Affiliations

G. Govindaraj

  • Department of Nuclear Physics, University of Madras, Guindy Campus, Madras 600025, Tamilnadu, India

V. Devanathan*

  • Institut für Theoretische Physik der Johann Wolfgang Goethe-Universität, D-6000 Frankfurt am Main, West Germany

  • *Permanent address: Department of Nuclear Physics, University of Madras, Madras 600025, Guindy Campus, Tamilnadu, India.

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Vol. 32, Iss. 4 — 15 August 1985

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