Low-Temperature Electrical and Thermal Resistivities of Tungsten

D. K. Wagner, J. C. Garland, and R. Bowers
Phys. Rev. B 3, 3141 – Published 15 May 1971
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Abstract

Measurements of ρ and WT (ρ is the electrical resistivity and W is the thermal resistivity) of high-purity single-crystal specimens of tungsten have been performed in the temperature range 1.5-6.0 K. The temperature dependence of ρ and WT was found to be predominantly quadratic, in agreement with observations in other transition metals. We attribute this behavior to electron-electron scattering between different branches of the Fermi surface. The validity of Matthiessen's rule for impurity and boundary scattering was investigated to determine whether the contributions of electron-electron scattering ρe and WeT could be meaningfully separated from the total resistivities ρ and WT. In those samples in which boundary scattering contributed least to the total resistivities, Matthiessen's rule was found to be reasonably well obeyed for the electrical resistivity, while deviations were observed for the thermal resistivity. The Lorenz number for electron-electron scattering, Le=ρeWeT, for these samples was found to range from 0.2×108 to 0.4×108 WΩ/K2.

  • Received 13 January 1971

DOI:https://doi.org/10.1103/PhysRevB.3.3141

©1971 American Physical Society

Authors & Affiliations

D. K. Wagner

  • Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, New York 14850

J. C. Garland

  • Department of Physics, The Ohio State University, Columbus, Ohio 43210

R. Bowers

  • Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, New York 14850

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Vol. 3, Iss. 10 — 15 May 1971

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