Stress dependence of the paraexciton in Cu2O

A. Mysyrowicz, D. P. Trauernicht, J. P. Wolfe, and H. -R. Trebin
Phys. Rev. B 27, 2562 – Published 15 February 1983
PDFExport Citation

Abstract

The energy shift of the paraexciton in Cu2O is measured by detecting its luminescence. The stress dependence, which differs significantly from that of the orthoexciton, agrees well with a theoretical calculation.

  • Received 21 October 1982

DOI:https://doi.org/10.1103/PhysRevB.27.2562

©1983 American Physical Society

Authors & Affiliations

A. Mysyrowicz*, D. P. Trauernicht, and J. P. Wolfe

  • Physics Department and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801

H. -R. Trebin

  • Institut für Theoretische Physik, Universitat Regensburg, Regensburg, West Germany

  • *Permanent address: Groupe de Physique des Solides de l'Ecole Normale Supérieure, 75005 Paris, France.

References (Subscription Required)

Click to Expand
Issue

Vol. 27, Iss. 4 — 15 February 1983

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×