Charge-density analysis of GaS

A. Kuhn, A. Bourdon, J. Rigoult, and A. Rimsky
Phys. Rev. B 25, 4081 – Published 15 March 1982
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Abstract

The electron density in the AIIIBVI crystal GaS was experimentally determined by x-ray diffraction. The resulting density distribution varies markedly from the distribution predicted by the pseudopotential model proposed by Schlüter et al. The real bonds observed in the x-ray diffraction determined distribution are curved and are located not only between Ga-Ga and Ga-S nearest neighbors as predicted by the pseudopotential model, but also between Ga and S next-nearest neighbors in the same elementary cell, between Ga and S atoms in adjoining elementary cells, and between S-S interlayer neighbors in the same elementary cell. The two atoms Ga and S are highly polarized. These findings allow a better understanding of the bondings and the discrepancies between our experimental findings, and the present pseudopotential model should permit an improvement in a future theoretical model for bonding in the AIIIBVI crystals.

  • Received 21 July 1980

DOI:https://doi.org/10.1103/PhysRevB.25.4081

©1982 American Physical Society

Authors & Affiliations

A. Kuhn* and A. Bourdon*

  • Laboratoire de Luminescence, Université Pierre et Marie Curie, 4 place Jussieu, 75230 Paris Cedex 05, France

J. Rigoult and A. Rimsky

  • Laboratoire de Minéralogie-Cristallographie, Université Pierre et Marie Curie, 4 place Jussieu, 75230 Paris Cedex 05, France

  • *Equipe de Recherche associée au CNRS.
  • Laboratoire associé au CNRS.

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Vol. 25, Iss. 6 — 15 March 1982

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