Theory of extended x-ray-absorption fine structure in a mixed-valence solid

W. Kohn, T. K. Lee, and Y. R. Lin-Liu
Phys. Rev. B 25, 3557 – Published 15 March 1982
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Abstract

This paper makes a contribution towards understanding recent extended x-ray-absorption fine-structure (EXAFS) measurements on the mixed-valence solid SmxY1xS. These experiments have been interpreted as showing that the difference δR between the nearest-neighbor distances Sm2+-S2 and Sm3+-S2 is less than 0.05 Å. The difference between the ionic radii of Sm2+ and Sm3+ is much larger, 0.18 Å. We show that in the fluctuating-valence solid the large electronic hybridization energy (enhanced by the sixfold degeneracy of the Sm3+ configuration), tends to strongly reduce the dependences of the positions of S2 ions on the valency of the Sm ions. We find that δR lies in the range between 0.045 and 0.06 Å, and could possibly be even smaller if a better estimate of the crucial hybridization matrix element Δπ should become available.

  • Received 17 August 1981

DOI:https://doi.org/10.1103/PhysRevB.25.3557

©1982 American Physical Society

Authors & Affiliations

W. Kohn, T. K. Lee, and Y. R. Lin-Liu

  • Institute for Theoretical Physics, University of California, Santa Barbara, California 93106

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Vol. 25, Iss. 6 — 15 March 1982

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