Multielectron coincidence study of the double Auger decay of 3d-ionized krypton

E. Andersson, S. Fritzsche, P. Linusson, L. Hedin, J. H. D. Eland, J.-E. Rubensson, L. Karlsson, and R. Feifel
Phys. Rev. A 82, 043418 – Published 19 October 2010

Abstract

Multielectron coincidence data for triple ionization of krypton have been recorded above the 3d ionization threshold at two photon energies (140 and 150 eV). Three principal transition pathways have been observed, two involving double Auger transitions from Kr+, and one involving single Auger transitions from Kr2+ created by direct single-photon double ionization. The decay of the 3d9 2D5/2,3/2 states in Kr+ has been analyzed in some detail and is found to be strongly dominated by cascade processes where two electrons with well-defined energies are emitted. The decay paths leading to the 4s24p3 4S, 2D, and 2P states of Kr3+ are analyzed and energies of seven intermediate states in Kr2+ are given. A preliminary investigation of the decay paths from Kr+ 3d94p5nl shake-up states has also been carried out.

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  • Received 7 April 2010

DOI:https://doi.org/10.1103/PhysRevA.82.043418

©2010 American Physical Society

Authors & Affiliations

E. Andersson1, S. Fritzsche2,3, P. Linusson4, L. Hedin1, J. H. D. Eland5, J.-E. Rubensson1, L. Karlsson1, and R. Feifel1

  • 1Department of Physics and Astronomy, Uppsala University, Box 516, SE-751 20 Uppsala, Sweden
  • 2Department of Physics, P.O. Box 3000, Fin-90014 University of Oulu, Finland
  • 3GSI Helmholtzzentrum für Schwerionenforschung, D-64291 Darmstadt, Germany
  • 4Department of Physics, Stockholm University, AlbaNova University Centre, SE-106 91 Stockholm, Sweden
  • 5Department of Chemistry, Physical and Theoretical Chemistry Laboratory, Oxford University, South Parks Road, Oxford OX1 3QZ, United Kingdom

See Also

Multielectron spectroscopy: Auger decays of the krypton 3d hole

J. Palaudoux, P. Lablanquie, L. Andric, K. Ito, E. Shigemasa, J. H. D. Eland, V. Jonauskas, S. Kučas, R. Karazija, and F. Penent
Phys. Rev. A 82, 043419 (2010)

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Vol. 82, Iss. 4 — October 2010

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