Evaluation of X Architecture Using Interconnect Length Distribution

Hidenari NAKASHIMA
Naohiro TAKAGI
Junpei INOUE
Kenichi OKADA
Kazuya MASU

Publication
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences   Vol.E88-A    No.12    pp.3437-3444
Publication Date: 2005/12/01
Online ISSN: 
DOI: 10.1093/ietfec/e88-a.12.3437
Print ISSN: 0916-8508
Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Interconnect
Keyword: 
X architecture,  interconnect length distribution,  ILD,  Rent's rule,  all-directional interconnect,  

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Summary: 
In this paper, we propose a new Interconnect Length Distribution (ILD) model to evaluate X architecture. X architecture uses 45-wire orientations in addition to 90-wire orientations, which contributes to reduce the total wire length and the number of vias. In this paper, we evaluated interconnect length distribution of diagonal (45orientations) and all-directional wiring. The average length and the longest length of interconnect are estimated, and 18% reduction in power consumption and 17% improvement in clock frequency can be obtained by the diagonal wiring in the experimental results. The all-directional wiring does not have large advantage as compared the diagonal wiring.

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