Evaluation of lattice motion in CdTe single crystal using in-air tabletop time-resolved X-ray diffractometer

A bulk single crystal sample of cadmium telluride (CdTe) was irradiated with a ∼3 mJ/cm² infrared femtosecond laser and analyzed with time-resolved X-ray diffraction (XRD) performed on an in-air tabletop designed for an extremely short pulsed X-ray source. The integrated intensity of Kα XRD lines from the CdTe (111) plane was decreased by 4%–5% in the time scale of ∼200 ps. The changes in integrated intensity of the XRD line were induced by the thermal effect of the CdTe lattice propagating at the acoustic velocity in the crystal.