Synthesis and characterisation of copper oxide thin films by double dip method

Cupric Oxide thin films were prepared and deposited on glass plate by double-dip method. The study was conducted on samples annealed at different temperatures. The deposited films showed poly crystalline nature with a preferred orientation of monoclinic structure along (111) plane. The thicknesses, as well as the refractive indices of all the films, were determined by using Near Normal Spectroscopic Reflectometry. Optical studies revealed a decrease in band gap with annealing temperature. The V-I graphs were found to be linear for a short-range when measured by two probe method. The thin films showed a resistivity of the order of kΩ-cm. An increase in electrical conductivity with temperature reveals the semiconducting nature of the thin films.