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Electron-impact ionization-excitation of atoms

Published under licence by IOP Publishing Ltd
, , Citation Klaus Bartschat 2008 J. Phys.: Conf. Ser. 141 012002 DOI 10.1088/1742-6596/141/1/012002

1742-6596/141/1/012002

Abstract

As a highly correlated process, simultaneous electron-impact ionization-excitation presents a major challenge to experimentalists and theorists alike. Taking advantage of significant improvements in multi-hit detector technology and the rapid increase of computational power, a number of advances have recently been reported. The current state-of the-art in this field is illustrated by a few key examples.

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10.1088/1742-6596/141/1/012002