Optimal static and dynamic recycling of defective binary devices

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Published 16 November 2004 IOP Publishing Ltd
, , Citation Damien Challet and Isaac Pérez Castillo J. Stat. Mech. (2004) P11003 DOI 10.1088/1742-5468/2004/11/P11003

1742-5468/2004/11/P11003

Abstract

The binary defect combination problem consists in finding a fully working subset from a given ensemble of imperfect binary components. We determine the typical properties of the model using methods of statistical mechanics, in particular the region in the parameter space where there is almost surely at least one fully working subset. Dynamic recycling of a flux of imperfect binary components leads to zero wastage.

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10.1088/1742-5468/2004/11/P11003