SYNCHROTRON RADIATION, FREE ELECTRON LASER, APPLICATION OF NUCLEAR TECHNOLOGY, ETC.

Electro-optical sampling non-synchronous delay scanning measurement of electron beam bunch length at BFEL

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2010 Chinese Physical Society and the Institute of High Energy Physics of the Chinese Academy of Sciences and the Institute of Modern Physics of the Chinese Academy of Sciences and IOP Publishing Ltd
, , Citation Sun Da-Rui et al 2010 Chinese Phys. C 34 227 DOI 10.1088/1674-1137/34/2/014

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sunray@ihep.ac.cn

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1 Institute of High Energy Physics, CAS, Beijing 100049, China

Dates

  1. Received 24 June 2009
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1674-1137/34/2/227

Abstract

The Electro-optical sampling delay scanning technique can be used for electron beam bunch length measurement. A novel non-synchronous delay scanning technique based on the electro-optical sampling measurements is presented. Based on Beijing Free Electron Laser (BFEL), the electron beam bunch length was measured with the electro-optical sampling technique for the first time in China. The result shows that the electron beam bunch length at BFEL is about 5.6 ± 1.2 ps.

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