Abstract
Metallophthalocyanine (MPc) twin-layer thin films on glass substrates, consisting of copper phthalocyanine (CuPc) overlayer and amorphous vanadyl phthalocyanine (VOPc) as well as titanyl phthalocyanine (TiOPc) buffers, were found to have different gas sensing characteristics. These twin-layer thin films were studied using x-ray photoemission spectroscopy. Photoelectrons of either V or Ti core levels were found to be present at the surface, indicating the existence of possible molecular migrations. The stability of the twin-layers under thermal annealing up to a maximum temperature of 250°C and low-energy Ar ion bombardment was also examined and compared with that of CuPc directly grown on the substrates. We concluded that the twin-layer structures were thermally fairly stable. Ar ion bombardment, however, caused substantial damage to the Pc ligands and a reduction of the valence state of the central Cu atoms.