Microstructure and fractal formation of annealed Ge-Au film and Ge-Au/Au bilayer films

, , and

Published under licence by IOP Publishing Ltd
, , Citation Ba Long et al 1996 Acta Phys. Sin. (Overseas Edn) 5 530 DOI 10.1088/1004-423X/5/7/007

Download Article PDF

Article metrics

37 Total downloads

Share this article

Author affiliations

1 Fundamental Physics Center, University of Science and Technology of China, Hefei 230026, China

2 Microstructure Research Laboratory, University of Science and Technology of China, Hefei 230026, China

Dates

  1. Received 9 May 1995
1004-423X/5/7/530

Abstract

The as-deposited and annealed Ge-Au film and Ge-Au/Au bilayer films have been observed by transmission electron microscopy. The bilayer with a composition of Ge-5at%Au film is amorphous, while the Ge-22at%Au film is polycrystalline. Higher concentration of Au raises the structural heterogeneity and instability. Fractals can be observed in the Ge-5at%Au/Au bilayer samples annealed at 60-100°C. The difference of the fractal patterns generated from Ge-Au/Au and a-Ge/Au films can be attributed to the higher heterogeneity and instability in Ge-Au/Au bilayers.

Export citation and abstract BibTeX RIS

Previous article in issue
Next article in issue
10.1088/1004-423X/5/7/007