Transport current ac losses and current-voltage curves of multifilamentary Bi-2223/Ag tape with artificial defects

We experimentally studied the effects of a single artificial defect and a linear array of artificial defects on I-V curves, critical currents and transport current ac losses of 55 filament untwisted Bi-2223/Ag tapes. The artificial defect was a small hole drilled into the tape. The reduction in the critical current measured on a 1 cm long section due to one hole of diameter 0.9 mm was 33% and that due to a linear array of seven similar holes was 62%. The slopes of the I-V curves, n, measured in this section were 33, 16 and 5.8 in the original sample, in the sample with one defect and the sample with seven defects, respectively. Both I_c and the slope reduction were smaller if the distance between the potential taps was increased. The transport current ac losses at 50 Hz and I_rms =  10 A in the sample with one defect measured in a 1 cm long section were practically the same as those in the original sample (4.1×10^-4 W m^-1), but they increased by 83% in the sample with a linear array of seven defects. The measured increase in losses per unit length was the smaller, the larger the distance between the potential taps. A comparison between the measured and calculated losses revealed that a formal application of the Norris equations for loss calculations in samples with local defects leads to an overestimation of the ac losses. A procedure for the calculation of transport current losses in samples with local defects based on the Norris model is proposed and verified.