Abstract
Describes a number of analytical and numerical calculations related to the model microfield method applied to Stark broadening (in particular, treatment of strong collisions and angular averages). This method is used for several types of profile: He I overlapping lines, Li I and Mg I resonance lines and Li I and O I non-resonance lines. For each of these, various approximations are discussed and the profiles are compared to those obtained from other theories and to experimental results. In particular, it is shown that the forbidden components cannot be obtained correctly using the usual approximation in which the electronic broadening is calculated independently of the ionic microfield.