Abstract
The authors bring together tables of current defect nomenclature and a summary of the rules actually practised (rather than idealised schemes) in choosing such labels for signals obtained with a range of spectroscopies. As well as providing a source of reference for the user lost in a maze of labels, the compilation also indicates parallels between similar defect species in very different systems (e.g. ice and quartz), even though the relationships may be far from obvious from the labels. The systems considered are all non-metals, namely ionic crystals (including oxides), silica, semiconductors (e.g. III-V and tetrahedrally coordinated II-VI), valence crystals (e.g. diamond, c-Si, a-Si) and other special hosts like ice and conducting polymers.
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