Abstract
The integrated Weibull function is shown to be well fitted to experimental V-I curves of oxide samples in the range of 4 approximately 5 decades of voltage. By this function the distribution of local critical current is obtained. Morphological characteristics of samples are estimated from the logJk-logJc plots for many B and T where Jk and Jc are two of the four Weibull parameters. Characteristics of the other two are also shown.
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