Abstract
Measurements of the changes in intensity distribution have been made, using a Geiger counter spectrometer, in the spectra of cold worked silver. An attempt has been made to interpret the Fourier coefficients of pure x-ray diffraction line profiles by assuming Gaussian as well as Cauchy strain distributions. Finite values of domain sizes and lattice strains have been obtained in both cases. Except at room temperature, where a twin fault probability β equal to 0.01 is obtained, the composite broadening in each case has been attributed partly to strain and partly to small particle size. From a study of the variation of particle size with temperature, recovery and recrystallization stages have been clearly identified. Observations on annealing of dislocations support the recent electron microscope observations that dislocations are arranged in a cell structure.