Electronic speckle pattern interferometry

Published under licence by IOP Publishing Ltd
, , Citation Ole Lekberg 1980 Physics in Technology 11 16 DOI 10.1088/0305-4624/11/1/303

Download Article PDF

Article metrics

1489 Total downloads

Share this article

Author affiliations

1 Professor at the University of Minnesota, Department of Electrical Engineering

Buy this article in print

0305-4624/11/1/16

Abstract

Electronic speckle pattern interferometry can provide high-speed, real-time holography for industrial research and inspection. This article discusses its basic principles, modes of operation and applications, and finally tries to assess its future importance for industry.

Export citation and abstract BibTeX RIS

Previous article in issue
Next article in issue
10.1088/0305-4624/11/1/303