Abstract
Far-infrared reflectivity measurements are reported for n- and p-type SnS single crystals between 10K and 300K using polarized radiation in the frequency range 50-350 cm-1. Kramers-Kronig and least-squares fitting analyses are used to determine the values of the phonon frequencies and dielectric constants for light polarized parallel to the a, b and c crystal axes. Transmission measurements on thin samples are also reported which confirm the reflectivity measurements.