EXAFS and surface EXAFS from measurements of X-ray reflectivity

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, , Citation R Fox and S J Gurman 1980 J. Phys. C: Solid State Phys. 13 L249 DOI 10.1088/0022-3719/13/11/002

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1 Dept. of Phys., Univ. of Leicester, Leicester, UK

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0022-3719/13/11/L249

Abstract

Calculated X-ray reflectivity spectra near glancing incidence show extended fine structure. The authors show that such spectra are surface sensitive and may be used to determine structural parameters for both substrates and absorbed overlayers.

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10.1088/0022-3719/13/11/002