Semiconductor laser facet reflectivities using free-space radiation modes
Semiconductor laser facet reflectivities using free-space radiation modes
- Author(s): P.C. Kendall ; D.A. Roberts ; P.N. Robson ; M.J. Adams ; M.J. Robertson
- DOI: 10.1049/ip-j.1993.0009
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- Author(s): P.C. Kendall 1 ; D.A. Roberts 1 ; P.N. Robson 1 ; M.J. Adams 2 ; M.J. Robertson 2
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View affiliations
-
Affiliations:
1: Department of Electronic & Electrical Engineering, University of Sheffield, Sheffield, UK
2: BT Laboratories, British Telecom, Ipswich, UK
-
Affiliations:
1: Department of Electronic & Electrical Engineering, University of Sheffield, Sheffield, UK
- Source:
Volume 140, Issue 1,
February 1993,
p.
49 – 55
DOI: 10.1049/ip-j.1993.0009 , Print ISSN 0267-3932, Online ISSN 2053-9088
Free-space radiation modes are used to determine a new formula for the main mode reflectivity of a multicoated semiconductor laser facet at normal incidence. The results are shown to compare favourably with exact values, and to provide some unification for the Fresnel methods.
Inspec keywords: optical films; semiconductor lasers; laser theory; reflectivity; laser modes
Other keywords:
Subjects: Semiconductor lasers; Lasing action in semiconductors; Optical coatings and filters; Optical coatings
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