Issue 7, 2006

Imprinting well-controlled closed-nanopores in spin-on polymeric dielectric thin films

Abstract

The use of low dielectric constant (low-k) interdielectrics in multilevel structure integrated circuits (ICs) can lower line-to-line noise in interconnects and alleviate power dissipation issues by reducing the capacitance between the interconnect conductor lines. Because of these merits, low-k interdielectric materials are currently in high demand in the development of advanced ICs. This article reviews recent developments in the imprinting of closed nanopores into spin-on materials to produce low-k nanoporous interdielectrics for the production of advanced ICs.

Graphical abstract: Imprinting well-controlled closed-nanopores in spin-on polymeric dielectric thin films

Article information

Article type
Feature Article
Submitted
08 Aug 2005
Accepted
21 Sep 2005
First published
14 Oct 2005

J. Mater. Chem., 2006,16, 685-697

Imprinting well-controlled closed-nanopores in spin-on polymeric dielectric thin films

M. Ree, J. Yoon and K. Heo, J. Mater. Chem., 2006, 16, 685 DOI: 10.1039/B511301F

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