Issue 15, 2013
From the journal:

Nanoscale

Reduced linewidth multipolar plasmon resonances in metal nanorods and related applications†

Shunping Zhang,ab   Li Chen,ac   Yingzhou Huangd  and  Hongxing Xu*abe  

* Corresponding authors

a Beijing National Laboratory for Condensed Matter Physics and Institute of Physics, Chinese Academy of Sciences, Box 603-146, Beijing 100190, China
E-mail: hxxu@iphy.ac.cn

b Center for Nanoscience and Nanotechnology, School of Physics and Technology, Wuhan University, Wuhan 430072, China

c Department of Applied Physics, Hunan University, Changsha 410082, China

d Department of Applied Physics, Chongqing University, Chongqing 400044, China

e Division of Solid State Physics/The Nanometer Structure Consortium, Lund University, Box 118, Lund, Sweden

Abstract

Using dark-field scattering spectroscopy, we study the multipolar plasmon resonances in single crystallized silver nanorods. The lineshapes and homogenous linewidths of the surface plasmon resonances (SPRs) of different orders are analyzed and compared. The high-order resonances are found to sustain asymmetric Fano lineshapes and their linewidths are narrower than the dipolar resonance. A quantitative comparison using the finite element method reveals more than a three times reduction in the linewidth for the third order resonance, as compared with the dipolar one. These narrow linewidths result from the smaller radiative damping of the multipolar SPRs. Benefiting from the reduced damping, multipolar SPRs in nanorods are better candidates for many plasmonic applications, including increased-sensitivity single particle SPR sensors and reduced-threshold nanolasers.

Graphical abstract: Reduced linewidth multipolar plasmon resonances in metal nanorods and related applications

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Article information

DOI
https://doi.org/10.1039/C3NR01219K
Article type
Paper
Submitted
10 Mar 2013
Accepted
08 May 2013
First published
13 May 2013

Nanoscale, 2013,5, 6985-6991

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Reduced linewidth multipolar plasmon resonances in metal nanorods and related applications

S. Zhang, L. Chen, Y. Huang and H. Xu, Nanoscale, 2013, 5, 6985 DOI: 10.1039/C3NR01219K

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