Issue 20, 2011

Multiferroic and fatigue behavior of silicon-based bismuth ferrite sandwiched structure

Abstract

Sandwich structured (Bi0.92La0.08)(Fe0.87Zn0.13)O3/(Bi0.92La0.08)(Fe0.93Zn0.07)O3/(Bi0.92La0.08)(Fe0.87Zn0.13)O3 thin films were prepared on Pt/TiO2/SiO2/Si(100) substrates by radio frequency sputtering. High (110) orientation is induced in these sandwiched structures due to the introduction of the bottom (Bi0.92La0.08)(Fe0.87Zn0.13)O3 layer with a (110) orientation. The space–charge-limited current mechanism is identified to dominate the leakage behavior of these sandwiched structures, and the lowest leakage current density is well established in such a sandwiched structure with a thickness ratio of 1 : 1 : 1 owing to its denser microstructure. All sandwiched structures demonstrate good fatigue behavior at a switching cycle of ∼2.96 × 109 and similar saturated MH loops with 2M ∼ 15.5 emu cm−3 due to the interface coupling among these constituent layers. The sandwiched structure with a thickness ratio of 1 : 1 : 1 possesses a better PE loop with a high remanent polarization of 2Pr ∼ 142.6 μC cm−2 and a low coercive field of 2Ec ∼ 695.0 kV cm−1. As a result, the sandwiched structure is an effective way to improve the multiferroic and fatigue behavior of bismuth ferrite materials.

Graphical abstract: Multiferroic and fatigue behavior of silicon-based bismuth ferrite sandwiched structure

Article information

Article type
Paper
Submitted
21 Nov 2010
Accepted
08 Mar 2011
First published
05 Apr 2011

J. Mater. Chem., 2011,21, 7308-7313

Multiferroic and fatigue behavior of silicon-based bismuth ferrite sandwiched structure

J. Wu, J. Wang, D. Xiao and J. Zhu, J. Mater. Chem., 2011, 21, 7308 DOI: 10.1039/C0JM04026F

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