Measuring the orientation of a single CdSe/CdS nanocrystal at the end of a near-field tip for the realization of a versatile active SNOM probe

R. Jazi; T. P. L. Ung; P. Maso; G. Colas Des Francs; M. Nasilowski; B. Dubertret; J.-P. Hermier; X. Quélin; S. Buil

doi:10.1039/C8CP02147C

Measuring the orientation of a single CdSe/CdS nanocrystal at the end of a near-field tip for the realization of a versatile active SNOM probe

R. Jazi,^a T. P. L. Ung,^a P. Maso,^a G. Colas Des Francs,^b M. Nasilowski,^c B. Dubertret,^c J.-P. Hermier,^a X. Quélin^a and S. Buil

*^a

Author affiliations

* Corresponding authors

^a Groupe d’Étude de la Matière Condensée (GEMaC), Université de Versailles-Saint-Quentin-en-Yvelines, CNRS UMR8635, Université Paris-Saclay, 45, Avenue des États-Unis, Versailles F-78035, France
E-mail: stephanie.buil@uvsq.fr

^b Laboratoire Interdisciplinaire Carnot de Bourgogne (ICB), UMR 6303 CNRS, Université Bourgogne Franche-Comté, 9 Avenue Savary, BP 47870, Dijon Cedex 21078, France

^c Laboratoire de Physique et d’Étude des Matériaux, Sorbonne Universités, UPMC Univ Paris06, CNRS UMR8213, ESPCI, 10, rue Vauquelin, Paris F-75231, France

Abstract

The orientation of a CdSe/CdS nanocrystal attached at the end of a scanning near field optical microscope (SNOM) tip is analyzed by its coupling with a flat gold layer. The Purcell factors for a set of distances to the gold surface are measured after a NC is caught by a SNOM tip. These measurements are compared with the modeling of the emission of a 2D dipole on a gold layer taking into account the layer of polymer serving as a glue for the NC. The 2D dipole is perpendicular to the c-axis of the NC, which is the growth axis. The behavior of the Purcell factor as a function of the distance to the gold layer depends on the angle made by this axis and the surface. The adjustment of the experimental results and the modelization gives the orientation of the NC at the end of the SNOM tip. Different orientations of the c-axis are determined.

This article is part of the themed collection: 2018 PCCP HOT Articles

Article information

https://doi.org/10.1039/C8CP02147C

Article type

Paper

Submitted

04 Apr 2018

Accepted

18 May 2018

First published

07 Jun 2018

Download Citation

Phys. Chem. Chem. Phys., 2018,20, 16444-16448

Permissions

Request permissions

Measuring the orientation of a single CdSe/CdS nanocrystal at the end of a near-field tip for the realization of a versatile active SNOM probe

R. Jazi, T. P. L. Ung, P. Maso, G. Colas Des Francs, M. Nasilowski, B. Dubertret, J.-P. Hermier, X. Quélin and S. Buil, Phys. Chem. Chem. Phys., 2018, 20, 16444 DOI: 10.1039/C8CP02147C

To request permission to reproduce material from this article, please go to the Copyright Clearance Center request page.

If you are an author contributing to an RSC publication, you do not need to request permission provided correct acknowledgement is given.

If you are the author of this article, you do not need to request permission to reproduce figures and diagrams provided correct acknowledgement is given. If you want to reproduce the whole article in a third-party publication (excluding your thesis/dissertation for which permission is not required) please go to the Copyright Clearance Center request page.

Physical Chemistry Chemical Physics

Measuring the orientation of a single CdSe/CdS nanocrystal at the end of a near-field tip for the realization of a versatile active SNOM probe

Abstract

Article information

Download Citation

Permissions

Measuring the orientation of a single CdSe/CdS nanocrystal at the end of a near-field tip for the realization of a versatile active SNOM probe

Social activity

Search articles by author

Spotlight

Advertisements