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Cross-section TEM and Optical Characterization of Porous Silicon Multilayer Stacks

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Journal of Materials Science Letters

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Authors and Affiliations

  1. Departamento de Física Aplicada, C-XII, Universidad Autónoma de Madrid, 28049 Cantoblanco, Madrid, Spain

    R. J. Martín-Palma, R. Guerrero-Lemus, J. D. Moreno & J. M. Martínez-Duart

  2. Instituto de Ciencia de Materiales de Madrid, Consejo Superior de Investigaciones CientUficas (CSIC), 28049 Cantoblanco, Madrid, Spain

    R. J. Martín-Palma & P. Herrero

Authors
  1. R. J. Martín-Palma
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  2. P. Herrero
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  3. R. Guerrero-Lemus
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  4. J. D. Moreno
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  5. J. M. Martínez-Duart
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Martín-Palma, R.J., Herrero, P., Guerrero-Lemus, R. et al. Cross-section TEM and Optical Characterization of Porous Silicon Multilayer Stacks. Journal of Materials Science Letters 17, 845–847 (1998). https://doi.org/10.1023/A:1006654926348

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