Abstract
The increasingreliability of some manufactured products has led to fewer observedfailures in reliability testing. Thus, useful inference on thedistribution of failure times is often not possible using traditionalsurvival analysis methods. Partly as a result of this difficulty,there has been increasing interest in inference from degradationmeasurements made on products prior to failure. In the degradationliterature inference is commonly based on large-sample theoryand, if the degradation path model is nonlinear, their implementationcan be complicated by the need for approximations. In this paperwe review existing methods and then describe a fully Bayesianapproach which allows approximation-free inference. We focuson predicting the failure time distribution of both future unitsand those that are currently under test. The methods are illustratedusing fatigue crack growth data.
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Robinson, M.E., Crowder, M.J. Bayesian Methods for a Growth-Curve Degradation Model with Repeated Measures. Lifetime Data Anal 6, 357–374 (2000). https://doi.org/10.1023/A:1026509432144
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DOI: https://doi.org/10.1023/A:1026509432144