References
J. M. steigerwald, S. P. murarka and R. J. Gutmann, “Chemical Mechanical Planarization of Microelectronic Materials” (JohnWiley & Sons, NewYork, 1997).
C. K. hu, B. Luther, F. B. Kaufman, J. Humnel, C. Uzoh and D. J. Pearson, Thin Solid Films 262 (1995) 84.
S. Lakshminarayanan, J. M. steigerward, D. T. price, M. Bourgeois, T. P. chow, R. J. Gutmann and S. P. murarka, IEEE Electron. Device Lett. 15 (1994) 307.
R. Carpio, J. Farkas and R. Jairath, Thin Solid Films 266 (1995) 238.
V. Desai, T. Du, V. S. Chathapuram, D. Tamboli and K. B. Sundaram, in Proceeding of the 5th International Symposium on Chemical Mechanical Polishing (201st Electrochemcial Society Meeting, Philadephia, 2002).
Q. Luo, D. R. campbell and S. V. Babu, Langmuir 12 (1996) 3563.
Z. Stavreva, D. Zeidler, M. Plotner and K. Drescher, Appl. Surf. Sci. 91 (1995) 192.
R. J. gutmann, J.M. steigerwald, L. You, D. T. price, J. Neirynck, D. J. Duquette and S. P. murarka, Thin Solid Films 270 (1995) 596.
N. S. mcintyre, S. Sunder, D. W. Shoesmith and F. W. Stanchell, J. Vac. Sci. Technol. 18 (1981) 714.
S. W. gaarenstron and N. Winograd, J. Chem. Phys. 67 (1977) 3500.
H. Liang, J. M. martin and R. Lee, J. Electron. Mater. 30 (2001) 391.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Du, T., Desai, V. Chemical mechanical planarization of copper: pH effect. Journal of Materials Science Letters 22, 1623–1625 (2003). https://doi.org/10.1023/A:1026353028626
Issue Date:
DOI: https://doi.org/10.1023/A:1026353028626