Abstract
The electrochemical behaviours of the Magneli phase titanium oxides with the general formula TixO2x-1 have been investigated. Surface analysis of these ceramic materials was performed using X-ray photoelectron spectroscopy in order to determine the surface composition. It was shown that the surface layers contain mainly TiIV. When these materials are used as an anode for oxygen evolution, in sulfuric acid, the XPS spectrum shows considerable modification in the O1s region, due to an important contribution of hydroxyl groups and the adsorption of sulfate anions.
Similar content being viewed by others
References
R. R. MILLER-FOLK, R. E. NOFTLE and D. PLETCHER, J. Electroanal. Chem. 274 (1989) 257.
J. E. GRAVES, D. PLETCHER, R. L. CLARKE and F. C. WALSH, J. Appl. Electrochem. 21 (1991) 848.
M. ZWEYNERT, H. DÖRING, J. GARCHE, R. A. HUGGINS and W. WITSCHEL, I. S. E. 4th Meeting, Berlin, abstracts (1993) 650.
R. L. CLARKE and S. K. HARNSBERGER, Amer. Lab. 20 (1988) 6.
R. CLARKE and R. PARDOE in “Electrochemistry for a cleaner environment”, edited by D. Genders and N. Weinberg (Electrosynthesis, East Amherst NY, 1992) p. 349.
J. POUILLEAU, PhD thesis, University Pierre and Marie Curie, Paris, 1996.
J. L. DELPLANCKE and R. WINAND, Electrochim. Acta 33 (1988) 1539.
Idem, ibid. 33 (1988) 1551.
Y. SERRUYS, T. SAKOUT and D. GORSE, Surf. Sci. 282 (1993) 279.
C. D. WAGNER, W. M. RIGGS, L. E. DAVIS, J. F. MOULDERS and G. E. MULLENBERG, in “Handbook of X-ray photoelectron spectroscopy”, edited by G. E. Mullenberg (Perkin-Elmer Corporation, Eden Prairie, MN, 1979).
B. SIEMENSMEYER and J. W. SCHULTZE, Surf. Interface Anal. 16 (1990) 309.
S. K. SEN, J. RIGA and J. VERBIST, Chem. Phys. Lett. 39 (1976) 560.
H. O. FINKLEA, in “Semiconductor electrodes”, edited by H. O. Finklea (Elsevier, Amsterdam, 1988).
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
POUILLEAU, J., DEVILLIERS, D., GROULT, H. et al. Surface study of a titanium-based ceramic electrode material by X-ray photoelectron spectroscopy. Journal of Materials Science 32, 5645–5651 (1997). https://doi.org/10.1023/A:1018645112465
Published:
Issue Date:
DOI: https://doi.org/10.1023/A:1018645112465