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Relationships between interfacial interaction, electrode formulation and cofiring mismatch of relaxor-based multilayer ceramic devices

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Abstract

The drive for high reliability of multilayer ceramic chips requires perfect cofired heterogeneous interfaces that can be obtained by a reliable cofiring processing. The cofiring behavior between Pb-based relaxor ferroelectric and Ag-Pd electrode was investigated. The results obtained indicated evident interdiffusion and chemical reactions at the interface. These interfacial interactions caused the formation of an interlayer, especially for the addition of a suitable amount of ceramic powder into the Ag-Pd paste. An analysis of interfacial stress distribution demonstrated that a moderate interfacial layer tends to alleviate the cofiring mismatch between ceramic layers and electrode layer. In addition, the type of cofired interface between the ferroelectric and the Ag-Pd alloy electrode was confirmed to be a mixture of diffusion and compound type.

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Authors and Affiliations

  1. State Key Laboratory of New Ceramics and Fine Processing, Department of Materials Science and Engineering, Tsinghua University, Beijing, 100084, People’s Republic of China

    Ruzhong Zuo, Longtu Li & Zhilun Gui

Authors
  1. Ruzhong Zuo
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  2. Longtu Li
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  3. Zhilun Gui
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Zuo, R., Li, L. & Gui, Z. Relationships between interfacial interaction, electrode formulation and cofiring mismatch of relaxor-based multilayer ceramic devices. Journal of Materials Science: Materials in Electronics 12, 117–121 (2001). https://doi.org/10.1023/A:1011258321843

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  • DOI: https://doi.org/10.1023/A:1011258321843

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