Elsevier

Energy Procedia

Volume 92, August 2016, Pages 248-254
Energy Procedia

Carrier Lifetime in Liquid-phase Crystallized Silicon on Glass

https://doi.org/10.1016/j.egypro.2016.07.067Get rights and content
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Abstract

Liquid-phase crystallized silicon on glass (LPCSG) presents a promising material to fabricate high quality silicon thin films, e.g. for solar cells and modules. Barrier layers and a doped amorphous silicon layer are deposited on the glass substrate followed by crystallization with a line focus laser beam. In this paper we introduce injection level dependent lifetime measurements generated by the quasi steady-state photoconductance decay method (QSSPC) to characterize LPCSG absorbers. This contactless method allows a determination of the LPCSG absorber quality already at an early stage of solar cell fabrication, and provides a monitoring of the absorber quality during the solar cell fabrication steps. We found minority carrier lifetimes higher than 200ns in our layers (e.g. n-type absorber with ND=2x1015cm-3) indicating a surface recombination velocity SBL<3000cm/s at the barrier layer/Si interface.

Keywords

multicrystalline silicon
thin film
laser crystallization
carrier lifetime
quasi steady-state photoconductance

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Peer review by the scientific conference committee of SiliconPV 2016 under responsibility of PSE AG.