Computer-aided crystallographic analysis in the TEM
References (56)
- et al.
Orientation imaging: The emergence of a new microscopy
Met. Trans.
(1993) - et al.
Backscatter Kikuchi diffraction in the SEM for identification of crystallographic point groups
Scanning
(1989) - et al.
A resolution of the interface phase problem in titanium alloys
Acta Metall.
(1988) - et al.
- et al.
X-ray scattering factors computed from numerical Hartree-Fock wave functions
Acta Cryst.
(1968) - et al.
Determination of structure factors, lattice strains and accelerating voltage by energy filtered convergent beam electron diffraction
Ultramicroscopy
(1994) - et al.
Software “ACT, Automated crystallography for the TEM”
(2000)
Revised parameters of the analytic fits for coherent and incoherent scattered x-ray intensities of the first 36 atoms
Acta Cryst.
Methods and means for recognizing complex patterns
The determination of crystallographic textures from selected areas of a specimen by electron diffraction
Textures Microstructures
The relation between polycrystal deformation and single crystal deformation
Met. Trans.
Analysis of local strain in aluminium interconnects by energy filtered CBED
Ultramicroscopy
Using the Hough transform for HOLZ line identification in convergent beam electron diffraction
J. Microsc.
POWDER CELL, Programm zur Darstellung von Kristallstrukuren und Berechnung der zugehörigen Röntgendiffraktogramme für polykristalline Proben
Deutsche Bundesanstalt für Materialprüfung, Berlin
Automated determination of crystal orientations from electron backscattering patterns
Computerized analysis of Kikuchi patterns
A new procedure for automatic high precision measurements of the position and width of bands in backscatter Kikuchi patterns
A new procedure for automatic high precision measurements of the position and width of bands in backscatter Kikuchi patterns
Image processing procedures for analysis of electron diffraction patterns
Scanning Microsc.
Interface Sci.
Role of twinning in texture development and in plastic deformation of hexagonal materials
Textures Microstructures
Cited by (25)
Precipitation formation on ∑5 and ∑7 grain boundaries in 316L stainless steel and their roles on intergranular corrosion
2021, Acta MaterialiaCitation Excerpt :Fig. 9(c) displays a selected area diffraction pattern (SADP) from the particle region. Through the help of software TOCA for indexing of diffraction patterns [45], patterns from the particle and two adjacent grains could be independently indexed. The simulated pattern for the particles is provided in Fig. 9(d).
On the influence of the heat treatment on microstructure formation and mechanical properties of near-α Ti-Fe alloys
2019, Materials Science and Engineering: AStrain accumulation and fatigue crack initiation at pores and carbides in a SX superalloy at room temperature
2018, International Journal of FatigueCitation Excerpt :Furthermore, the site-specific observation of the deformation structures in the crack tip process zone is a major advantage, as this avoids any constraint relief artefacts that may result from TEM foil extraction at the crack tip. Accurate sample orientation information was obtained by EBSD at 70° to the sample surface normal and subsequent simulation of the electron channelling pattern (ECP) at 0° with software TOCA (Tools for Orientation Determination and Crystallographic Analysis) [42,43]. Any uncertainty in the orientation through misalignment of the EBSD system was corrected by a calibration of the ECP and EBSD patterns with single crystal Si.
Influence of stacking fault energy and dislocation character on slip transfer at coherent twin boundaries studied by micropillar compression
2018, Acta MaterialiaCitation Excerpt :Therefore, the measured orientations allow for the determination of the three-dimensional extension of each twin boundary. Following a crystallographic analysis of all suitable twin boundaries using the TOCA software of S. Zaefferer [36,37], a single grain was chosen to be orientated into one of the three compression modes described in Table 1. This reorientation was accomplished by the use of custom sample holders that incorporate locating surfaces to fix the selected twin boundaries into the desired orientation, see Fig. 3b.
On the origin of creep dislocations in a Ni-base, single-crystal superalloy: An ECCI, EBSD, and dislocation dynamics-based study
2016, Acta MaterialiaCitation Excerpt :To observe dislocations, the ECCI under controlled diffraction conditions (cECCI) method [23] was employed. The computer program TOCA [26,27] was used for selection of suitable diffraction conditions from simulated electron channeling pattern (ECP). EBSD measurements were carried out in a JEOL 6500F FEG scanning electron microscope operating at 15 kV accelerating voltage and high beam current mode and equipped with a Digiview 5 camera and the EDAX/TSL OIM DC software (version 7.0; EDAX/TSL, Draper, UT, USA).