Elsevier

Surface Science

Volumes 433–435, 2 August 1999, Pages 226-229
Surface Science

Photoemission study of the interaction of a reduced thin film SnO2 with oxygen

https://doi.org/10.1016/S0039-6028(99)00044-8Get rights and content

Abstract

The interaction of oxygen with a reduced thin film SnO2 has been studied with X-ray photoelectron spectroscopy. Three surface oxygen species (O, O2−2, O2) were observed in the valence band spectra after O2 exposure onto the reduced SnO2 thin film. O and O2−2 were assumed to be adsorbed on the Sn2+ sites and O2 ions were on the Sn4+ sites. These oxygen species were desorbed in the order O, O2−2 (>473 K) and O2 (>673 K).

Introduction

The surface electronic states of tin oxide have been intensively studied experimentally and theoretically [1], [2], [3], [4], [5], [6]. Very recently, we theoretically calculated the stability of oxygen anions on a reduced SnO2 (110) crystal surface using a point-charge model [7]. Oxygen species on the SnO2 surface were stabilized in the order of O2−2, O2−, O and O2. These results indicate the low concentration of O and O2 but O2−2 is expected to have a somewhat large concentration on the surface. Very few experimental studies of adsorbed oxygen species on reduced SnO2 surfaces have been examined [3], [8], [9]. Shen et al. [3] studied the interaction of O2 with SnO2 (110) and reported that the formation of superoxo O2 was suggested and this type of oxygen species desorbed from Sn2+ atoms around 250 K. Mizokawa and Nakamura [9] reported that this O2-type species desorbed around 420 K from polycrystalline SnO2. The formation of other oxygen species like O and O2−2 on SnO2 surfaces is controversial [10].

In this paper, we examine O2 adsorption onto a reduced SnO2 thin film at various temperatures up to 773 K. The chemisorbed states were examined on the X-ray photoelectron spectroscopy (XPS) spectra for the core levels and the valence band (VB) level. The chemical shift from Sn2+ to Sn4+ also was examined after oxygen exposure at each temperature in the VB spectra.

Section snippets

Experimental procedure

Tin oxide thin films were deposited on sapphire substrates by the reactive RF magnetron sputtering method using an SPF-430 apparatus produced by Nichiden Anelva. The sputtering target was sintered SnO2 (99.9% purity). We selected the sputtering conditions for preparing a dense texture. The details of the sputtering conditions are in our previous paper [6].

The details of XPS experimental procedure are also in our previous papers [11], [12]. A monochromatized Al Kα (1486.6 eV) X-ray source was used

Results and discussion

We measured the etched SnO2 thin film in the VB region as shown in Fig. 1. This spectral pattern shows that the surface state of the etched sample is mainly SnO2 [14]. However, the presence of the band gap emission shows the formation of Sn2+ ions, as reported on the reduced tin oxides [11], [12]. We considered the bridging oxygen was removed from the topmost layer and Sn2+ ions were produced. In order to obtain more quantitative information of the compositional changes of the surface layers,

Conclusions

Three surface oxygen species (O, O2−2, O2) were observed in the VB spectra after O2 exposure onto the reduced SnO2. These oxygen species were desorbed in the order of O, O2−2 (>473 K) and O2 (>673 K) as expected from our previous theoretical calculations about the stability of these oxygen ions on the reduced SnO2 [7]. O and O2−2 ions are assumed to be adsorbed on Sn2+ sites and O2 ions are at low coordinated Sn4+ sites.

Acknowledgements

This study was financially supported by the New Energy and Industrial Technology Development Organization (NEDO). One of us (K.T.) is grateful to Professor M.W. Roberts at Cardiff University for his discussions about oxygen species.

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