Elsevier

Microelectronics Reliability

Volume 43, Issues 9–11, September–November 2003, Pages 1577-1582
Microelectronics Reliability

Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS)

https://doi.org/10.1016/S0026-2714(03)00277-4Get rights and content

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