Achievement of ultra-high resolution by 400 kV analytical atomic-resolution electron microscopy

doi:10.1016/0304-3991(85)90118-4

Ultramicroscopy

Volume 18, Issues 1–4, 1985, Pages 19-31

https://doi.org/10.1016/0304-3991(85)90118-4 Get rights and content

Abstract

The factors for improving the resolution of conventional electron microscopes are discussed together with the physics of the formation of electron diffraction patterns and electron microscope images, and a method for obtaining images of atoms at their correct positions. The optical features of the 400 kV Analytical Atomic-Resolution Electron Microscope (AARM) installed in Osaka University are described. Some details of the energy-selecting atom resolution microscope and an on-line image processing system attached to the AARM are also discussed.

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Achievement of ultra-high resolution by 400 kV analytical atomic-resolution electron microscopy

Abstract

J. Appl. Phys.

J. Appl. Phys.

Proc. 7th Intern. Conf. on High Voltage Electron Microscopy

Proc. 8th European Congr. on Electron Microscopy, Budapest

Acta Cryst.

Chem. Scripta

Proc. Nobel Symp.

Electron Microscopy and Analysis 1981 (Proc. EMAG '81, Cambridge)