In-plane electronic speckle pattern shearing interferometry
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Cited by (16)
Digital shearography with in situ phase shift calibration
2012, Optics and Lasers in EngineeringCitation Excerpt :Since shearography was first introduced in 1973 [1,2], it has become a well-established tool for non-destructive testing [3], vibration analysis [4], curvature measurement [5–7], and full-field measurement of displacement derivatives [8,9]. Shearography can measure not only the spatial derivatives of the out-of-plane displacement, or slopes of deformation [10], but also the spatial derivatives of the in-plane displacement, or surface strains [11–13]. Unlike holography, which measures the displacement, shearography provides a direct measurement of the displacement derivative.
Measuring displacement derivatives by electronic speckle pattern shearing interferometry (ESPSI)
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